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    Part of the foundations of science and industry, measurement and analysis technologies are used in a wide variety of fields, including the development of new materials, biology, electronics, the environment, and renewable energy. Hitachi has contributed to the development of industry and society through measurement and analysis technology and its applications, having had a long involvement in instrumentation, electron microscopes, spectrophotometers, and other such devices. Along with strengthening its core technologies and expanding its product range, Hitachi is also pursuing collaborative creation and open innovation with customers in specialist fields, utilizing measurement and analysis technology to provide extensive support everywhere from the latest academic research to industry.

    Table of contents

    Attendee introduction

    Hiroshi Kitagawa, Ph.D.

    • Deputy Executive Vice-President for Research; Professor, Division of Chemistry, Graduate School of Science, Kyoto University
    • Graduated from the Faculty of Science at Kyoto University and undertook post-doctoral work in chemistry at its Graduate School of Science. After posts that included assistant professor of chemistry at the University of Tsukuba and professor of chemistry at the Graduate School of Science at Kyushu University, he took up his current position in 2009. Doctor of Science. His appointments include a councilor of the Japan Society of Coordination Chemistry.

    Tatsuo Ushiki, M.D., Ph.D.

    • Dean, Faculty of Medicine; Dean, Institute of Medicine and Dentistry; Professor of Microscopic Anatomy, Niigata University
    • Graduated from the School of Medicine, Niigata University and obtained a doctorate from the Graduate School of Medicine. Following appointments that included associate professor at Hokkaido University, he was appointed professor at the School of Medicine, Niigata University in 1995, and to his current position in 2014. Doctor of Medicine. His specialty is microscopic anatomy. His publications include an “Introduction to Histology” (published by Nankodo, in Japanese).

    Masaaki Sugiyama, Dr. Eng.

    • Specially Appointed Professor, Graduate School of Engineering, Osaka University
    • Graduated from the Division of Materials Physics, School of Engineering Science, Osaka University, and obtained a doctorate from its Graduate School of Engineering Science. After joining Nippon Steel Corporation (now Nippon Steel & Sumitomo Metal Corporation), he was engaged in research into fi rst ceramics, and then steel. He was involved in technology planning and the study of material microstructure control, primarily electron microscope technology. He was appointed to his current position in 2015. Doctor of Engineering. He is a member of the Japanese Society of Microscopy (JSM), The Japan Institute of Metals and Materials, and the Iron and Steel Institute of Japan.

    Sukehiro Ito

    • General Manager, Electron Microscope Systems Design Department, Science Systems Product Division, Science & Medical Systems Business Group, Hitachi High-Technologies Corporation
    • Joined Hitachi Naka Seiki, Ltd. in 1984 where he worked on the design and development of scanning electron microscopes. He is currently engaged in managing the design and development of electron microscopes and focused ion beam milling machines. He is a member of the JSM.

    Ryuichiro Tamochi

    • General Manager, Science Systems Business Development Department, Strategic Planning Division, Science & Medical Systems Business Group, Hitachi High-Technologies Corporation
    • Joined Hitachi Instrument Engineering Co., Ltd. in 1984 where he worked on the development of application technology for scanning electron microscopes. He is currently engaged in business strategy for scientifi c system products. He is a member of the JSM and The Surface Science Society of Japan.

    Hiroyuki Shinada, Ph.D.

    • Senior Chief Researcher, Center for Exploratory Research, Research & Development Group, Hitachi, Ltd.
    • Joined Hitachi, Ltd. in 1985 where he worked initially at the Central Research Laboratory and then in the research and development of semiconductor production and inspection machines based on electron microscopy and on electron sources and electron guns. He is currently engaged in development and applied research into holography electron microscopes. Doctor of Engineering. He is a member of the JSM, The Japan Society of Applied Physics, and the Society of Instrument and Control Engineers.

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