1. SU3800/3900 Scanning Electron Microscopes Satisfying Increasingly Diverse Customer Needs
The need for control over microstructures to enhance the functionality and performance of materials has resulted in the expansion of applications for scanning electron microscopes (SEMs) in recent years beyond traditional research and development into areas such as quality assurance and production management. This has led to demand for microscopes that are easier to use and that impose less stress on their operators.
The SU3800 and SU3900 combine operability and functionality by automating a variety of electron microscope operations such as axis adjustment and focus.
The microscopes also feature a number of new functions, including an Intelligent Filament Technology (IFT) function for extending operating time and providing an indication of how much time remains by monitoring and optimizing filament condition, the SEM MAP function for moving the stage to a specified location in a wide-angle optical camera image (the entire movable range of the stage), and a function for energy dispersive X-ray spectroscopy (EDS) integration that makes the microscope easier to use by combining all the steps from SEM observation to elemental analysis and reporting.
The large SU3900 model also has a sample stage with a diameter of 300 mm that can take samples of up to 5 kg (2.5 times the previous model), a feature that helps reduce the sample preparation workload (cutting, etc.) compared to previous models.
(Hitachi High-Tech Corporation)