—Joint Project to Implement Aberration Corrector in High-end TEM—
IN collaboration with the Center for Materials Elaboration and Structural Studies (CEMES), an institute of the French National Center for Scientific Research (CNRS), Hitachi High-Technologies Corporation has developed a high-end field emission-transmission electron microscope (FE-TEM) that incorporates a spherical aberration corrector. Delivered to CEMES in 2012, the instrument boasts the highest resolution in the world (spatial resolution of 0.5 nm in magnetic-field-free locations).
Marketing Department, Science Systems Sales & Marketing Division, Science & Medical Systems Business Group, Hitachi High-Technologies Corporation. He is currently engaged in the export marketing business for Europe.
Electron Microscope Systems Design 2nd Department, Science Systems Product Division, Science & Medical Systems Business Group, Hitachi High-Technologies Corporation. He is currently engaged primarily in the technical development and technical instruction of TEM. Mr. Taniguchi is a member of the Japanese Society of Microscopy (JSM) and The Japan Society of Applied Physics (JSAP).
