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    Hitachi Global
    Hitachi Global

    2016

    2016 Vol.65 No.1（March）

    ENTIRE EDITION
    From the Editor
    Social Infrastructure and ICT Development for e-Government
    Seeking "True Affluence" through Solution-based IT
    Public-sector IT Solutions Supporting Progress of Society
    Future Outlook for Japan's ID Number System
    Latest Trends and Future Outlook for Open Data: Making Public-sector Data Available to the Private Sector
    Infrastructure for Multilayer Interoperability to Encourage Use of Heterogeneous Data and Information Sharing between Government Systems
    Use of IoT by Government Institutions
    Development of Information Platform Service for Facilitating Reform of Work Practices and User Value Maximization
    Security Operation Management Initiatives in Cooperative Vehicle-Infrastructure Systems for Safe Driving
    Involvement in Digital Textbook Business for Realization of the Vision for ICT in Education
    Requirements Definition Technique for Public Systems
    Measures for Ensuring High Reliability in Public-sector Systems
    Techniques for Migration and Refactoring (Downsizing) of Application Assets
    Benefits and Uses of Private Cloud based on Next-generation Technology that Supersedes Virtualization
    Work on Cybersecurity Measures for Collaboration between Organizations
    Overseas Deployment of Japanese-style Public-sector Solutions that Contribute to the Development of Emerging Economies
    Comprehensive Lifestyle Support Service Using IT and TV for Bidirectional Communication
    Future Issues Facing Municipalities and Future Outlooks for Hitachi Municipality Solutions
    Operation and Maintenance Solution for Social Infrastructure such as Roads
    IT Solution for Campus Supporting System-wide Optimization and Faster University Reform

    2016 Vol.65 No.7（August）

    ENTIRE EDITION
    Use of Interdisciplinary Knowledge to Improve Measurement and Analysis Technology
    Expectations for Atomic-resolution Holography Electron Microscope
    Hitachi’s Measurement and Analysis Technologies for Future Science and Social Innovation
    Development of Aberration Correctors for the HD-2700, the HF3300S, the 1.2 MV FIRST Program, and Future Prospects
    Studies on Degradation Mechanism of Electrocatalysts for Fuel Cells through In-situ SEM/STEM Observation
    Microstructure Analysis by Means of the Orthogonallyarranged FIB-SEM
    Development of High-performance Zeolite Catalysts for Effective Use of Carbon Resources
    Advanced Biomedical Transmission Electron Microscopy
    Development of SEM for Realtime 3D Imaging and Its Applications in Biology
    Easy-to-use Atmospheric-pressure Scanning Electron Microscope for Food, Plants, and Tissue
    Nanoscale Imaging, Material Removal and Deposition for Fabrication of Cutting-edge Semiconductor Devices
    Measurement of Microscopic Three-dimensional Profiles with High Accuracy and Simple Operation
    Measurement of Surface Profile and Layer Cross-section with Wide Field of View and High Precision
    Fluorescence Pattern Analysis to Assist Food Safety
    Compact Mass Detector for Drug Discovery Research
    Rapid Detection and Element Identification of Fine Metal Particles for Underpinning Battery Quality
    Coating Thickness Measurement with High-performance for Latest Electronic Fine Components of Mobile Devices
    Ultrasonic Imaging of Microscopic Defects to Help Improve Reliability of Semiconductors and Electronic Devices
    An Inspection and Measurement Technology Platform Leading the Way to More Advanced Manufacturing
    Global Collaboration with CEMES, French National Center for Scientific Research
    TM Series Tabletop Microscopes: Creating a New Market, Initiatives for Social Responsibility